蔚華科表示,Multitest新世代測試解決方案整合印刷電路板及測試座的應用,可以為客戶提供最佳化的解決方案–滿足客戶『單一窗口、一次購足、一致性除錯』的需求,且從設計、模擬到量產提供更可靠的產品整合方案。且因應行動通訊與可攜式產品的快速成長,晶片設計追求更小的封裝尺寸與更高速運算,將展示下一世代0.3 mm Pitch的產品,高功率測試的解決方案、高速的應用及模擬。
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